Glossary of Acronyms and Abbreviations
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ACOM |
Automated Crystal lattice Orientation Microscopy |
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BCC |
Body-Centered Cubic crystal lattice |
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BKD |
BackScatter Kikuchi Diffraction |
| BKP |
BackScatter Kikuchi diffraction Pattern |
| CBED | Convergent Beam Electron Diffraction: Electron diffraction in the TEM with a wide-angular beam to produce Kossel-Möllendsted and Zone Axis Patterns |
| COM | Crystal Orientation Map, Orientation Map(ping) |
| EBSD | Electron BackScatter Diffraction: commercial term for ACOM with the SEM (not to confound with other backscatter electron diffraction techniques such as RHEED, LEED, ECP) |
| EBSP | Electron BackScattered Pattern (= BKP) |
| ECP | Electron Channeling Pattern: Backscatter electron diffraction pattern produced with a pivoting beam |
| EDS, EDX | Energy Dispersive X-ray Spectroscopy for element analysis using characteristic X-rays that have been excited by the impact of an electron beam on a specimen |
| Euler Map | COM using the Euler angles for color coding |
| FCC | Face-Centered Cubic crystal lattice |
| HCP | Hexagonal Close-Packed crystal lattice |
| HT | Hough Transform(ation), an image processing and analysis routine used to locate straight lines in a binary image. HT is a special case of RT. |
| IPF | IPF constructed by marking the individual grain directions (in color) on the standard triangle of the crystal lattice |
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IQ |
Indexing Quality: a measure of the angular deviations between detected and recalculated band positions |
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L |
camera Length: distance from the beam spot on the specimen to the pattern center on the phosphor screen |
| LEED | Low Energy Electron Diffraction. Backscatter electron diffraction with a primary beam of usually less than 5keV at normal incidence on a bulk crystal |
| Miller Map | COM using the Miller Indices of two reference directions for color coding |
| MBD | MicroBeam electron Diffraction : Electron diffraction in transmission or backscattering mode with a fine-focused beam spot |
| MODF | MisOrientation Distribution Function |
| OCF | Orientation Correlation Function |
| PC | Pattern Center: the footpoint (x, y) of the perpendicular line from the phosphor screen to the point of beam impact on the specimen |
| PF | Pole Figure |
| PF map | PF constructed by marking the individual grain orientations (in color) on the reference sphere or on the Wulff’s net, i.e. the standard projection of the reference sphere. |
| PQ | Pattern Quality: a measure of the crispness of the BKP and an indication of the perfectness of the diffracting crystal volume |
| RT | Radon Transform(ation), an image processing and analysis routine used to quantify gray-tone features in an image; in SEMdif Viewer the tool to locate positions of Kikuchi bands in the BKP |
| RHEED | Reflection High Energy Electron Diffraction = BKD, in particular at steep to grazing beam incidence |
| Rodrigues Map | COM using the Rodrigues vector as parameters for color coding |
| SAD | Selected Area electron Diffraction: Electron diffraction in the TEM using a selector aperture to limit the sampled area |
| SEM | Scanning Electron Microscope / Microscopy |
| S value | reciprocal value of the fraction of the coincident lattice sites of two superimposed crystal lattices |
| TEM | Transmission Electron Microscope / Microscopy |
| TKP | Transmission Kikuchi diffraction Pattern |
| XRD |
X-Ray Diffraction |