Glossary of Acronyms and Abbreviations
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ACOM |
A utomated C rystal lattice O rientation M icroscopy |
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BCC |
B ody- Centered C ubic crystal lattice |
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BKD |
B ack Scatter K ikuchi D iffraction |
| BKP |
B ack Scatter K ikuchi diffractionP attern |
| CBED | C onvergent B eam E lectronD iffraction: Electron diffraction in the TEM with a wide-angular beam to produce Kossel-Möllendsted and Zone Axis Patterns |
| COM | C rystal O rientation M ap, Orientation Map(ping) |
| EBSD | E lectron B ackS catter D iffraction: commercial term for ACOM with the SEM (not to confound with other backscatter electron diffraction techniques such as RHEED, LEED, ECP) |
| EBSP | E lectron Back Scattered P attern (= BKP) |
| ECP | E lectron C hanneling P attern: Backscatter electron diffraction pattern produced with a pivoting beam |
| EDS, EDX | E nergy D ispersive X -ray S pectroscopy for element analysis using characteristic X-rays that have been excited by the impact of an electron beam on a specimen |
| Euler Map | COM using the Euler angles for color coding |
| FCC | F ace- Centered C ubic crystal lattice |
| HCP | H exagonal C lose-P acked crystal lattice |
| HT | H ough T ransform(ation), an image processing and analysis routine used to locate straight lines in a binary image. HT is a special case of RT. |
| IPF | IPF constructed by marking the individual grain directions (in color) on the standard triangle of the crystal lattice |
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IQ |
I ndexing Q uality: a measure of the angular deviations between detected and recalculated band positions |
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L |
camera L ength: distance from the beam spot on the specimen to the pattern center on the phosphor screen |
| LEED | L ow E nergy E lectron D iffraction. Backscatter electron diffraction with a primary beam of usually less than 5keV at normal incidence on a bulk crystal |
| Miller Map | COM using the Miller Indices of two reference directions for color coding |
| MBD | M icro Beam electron D iffraction : Electron diffraction in transmission or backscattering mode with a fine-focused beam spot |
| MODF | M is Orientation D istribution F unction |
| OCF | O rientation C orrelationF unction |
| PC | P attern C enter: the footpoint (x, y) of the perpendicular line from the phosphor screen to the point of beam impact on the specimen |
| PF | P ole F igure |
| PF map | PF constructed by marking the individual grain orientations (in color) on the reference sphere or on the Wulff’s net, i.e. the standard projection of the reference sphere. |
| PQ | P attern Q uality: a measure of the crispness of the BKP and an indication of the perfectness of the diffracting crystal volume |
| RT | R adon T ransform(ation), an image processing and analysis routine used to quantify gray-tone features in an image; in SEMdif Viewer the tool to locate positions of Kikuchi bands in the BKP |
| RHEED | R eflection H igh E nergy E lectron D iffraction = BKD, in particular at steep to grazing beam incidence |
| Rodrigues Map | COM using the Rodrigues vector as parameters for color coding |
| SAD | S elected A rea electron D iffraction: Electron diffraction in the TEM using a selector aperture to limit the sampled area |
| SEM | S canning E lectron M icroscope / M icroscopy |
| S value | reciprocal value of the fraction of the coincident lattice sites of two superimposed crystal lattices |
| TEM | T ransmission Electron M icroscope / M icroscopy |
| TKP | T ransmission K ikuchi diffraction P attern |
| XRD |
X - Ray D iffraction |