Publications on individual grain orientation measurement (BKD, EBSD)
R. Schwarzer
Die Aufnahme von Reflexions-Kikuchi-Diagrammen im REM mit einer peltiergekühlten, integrierenden CCD-Videokamera.
Beitr. elektronenmikroskop. Abbildung Oberflächen (BEDO) 23(1989) 279-282R.A. Schwarzer
Local crystal textures: Experimental techniques and future trends.
Fresenius J. Anal. Chem. 361 (1998) 522-526H.J. Bunge and R.A. Schwarzer
Orientierungsstereologie - Ein neuer Zweig der Texturforschung.
TU-Contact 2 (1998) 67-73R.A. Schwarzer (ed.)
Proc. Intern. Conf. on Texture and Anisotropy of Polycrystals (ITAP-1).
Materials Science Forum 273-275 (1998)
TransTech Publications Ltd., Ütikon-Zürich, ISBN 0-87849-802-8B. Schäfer
Sampling error of texture approximation by individual orientation measurement.
Materials Science Forum 273-275 (1998) 99-105B. Schäfer
ODF computer program for high-resolution texture analysis of low-symmetry materials.
Materials Science Forum 273-275 (1998) 113-118F. Springer
Recent developments in automated crystal orientation mapping (ACOM) - Quantitative evaluation and graphical representation of individual grain orientation data.
Materials Science Forum 273-275 (1998) 191-200R.A. Schwarzer and J. Sukkau
Automated crystal orientation mapping (ACOM) with a computer-controlled TEM by interpreting transmission Kikuchi patterns.
Materials Science Forum 273-275 (1998) 215-222A. Huot, R.A. Schwarzer and J.H. Driver
Texture of shear bands in Al-Mg3% (AA5182) measured by BKD.
Materials Science Forum 273-275 (1998) 319-326A. Ziegenbein, H. Neuhäuser, J. Thesing, R. Ritter, H. Wittich, E. Steck, F. Springer and R.A. Schwarzer
Investigations on local plasticity of CuAl polycrystals by in-situ observations and FEM simulations.
Materials Science Forum 273-275 (1998) 363-368M. Lepper, A. von Glasow, D. Piscevic and R.A. Schwarzer
Crystal texture and electromigration damage in Al-based interconnect lines studied by ACOM with the SEM.
Materials Science Forum 273-275 (1998) 573-577R.A. Schwarzer
Orientation stereology by ACOM - A new means to characterize microstructure.
Proc. Intern. Materials Research Congress, Cancun 98 (Mexico), Academia Mexicana de Ciencia de Materiales, Cuernavaca (1998) 90F. Springer and R.A. Schwarzer
Applications of ACOM on bulk materials and thin films.
Proc. Intern. Materials Research Congress, Cancun 98 (Mexico), Academia Mexicana de Ciencia de Materiales, Cuernavaca (1998) 90A. Huot and R.A. Schwarzer
Texture of shear bands in Al-Mg3% (AA5182) and TiAl6V4 measured by BKD.
Proc. Intern. Materials Research Congress, Cancun 98 (Mexico), Academia Mexicana de Ciencia de Materiales, Cuernavaca (1998) 91R.A. Schwarzer
Crystallography and microstructure of thin films studied by x-ray and electron diffraction.
Proc. 6th Intern. Symposium on Trends and New Applications of Thin Films, Regensburg 18.-20. März 1998, Materials Science Forum 287-288 (1998) 23-60R.A. Schwarzer
Automated crystal orientation mapping (ACOM) - A new perspective on the characterization of microstructure.
Bulletin Czech and Slovak Crystallographic Association 5 (1998) 35-36 (Special Issue A - ECM-18)R.A. Schwarzer
Development of BKD hardware: Accomplishments and opportunities.
Proc. Microscopy and Microanalysis '99, Oregon 1999.
Microscopy and Microanalysis 5, Suppl. 2, (1999) 242-243R.A. Schwarzer
Advancements of ACOM and applications to orientation stereology.
Proc. 12th Intern. Conference on Textures of Materials (ICOTOM12), Montréal (Canada) (1999) 52-61R.A. Schwarzer
Modern diffraction techniques for the structural analysis of metal surfaces.
Handbuch zum Fachrahmenprogramm Geospectra 99 (1999) 42-43A. Huot, A.H. Fischer, A. von Glasow and R.A. Schwarzer
Quantitative texture analysis of Cu damascene interconnects.
In: O. Kraft, E. Arzt, C.A. Volkert, P. Ho and H. Okabayashi (eds.): Proc. 5th Intern. Workshop on Stress-Induced Phenomena in Metallization, MPI Stuttgart 1999.
AIP Conference Proceedings 491, Melville N.Y. (1999) 261-264A.H. Fischer, A. von Glasow, A. Huot and R.A. Schwarzer
Crystal texture of electroplated damascene Cu interconnects.
Proc. Advanced Metallization Conference 1999 (AMC), Orlando (Florida),
Materials Research Society, (1999) 137-141R.A. Schwarzer
Automated electron backscatter diffraction: Present state and prospects.
In: A. Schwartz, M. Kumar and B.L. Adams (eds.): Electron Backscatter Diffraction in Materials Science, Kluwer Academic / Plenum Publishers, 2000, pp. 105-122R.A. Schwarzer and A. Huot
The study of microstructure on a mesoscale by ACOM.
Crystal Research and Technology 35 (2000) 851-862R.A. Schwarzer
Measurement of macro-texture by ACOM - An alternative to XRD.
Materials Science and Technology 16 (2000) 1384-1388R.A. Schwarzer, A.K. Singh and J. Sukkau
Discrimation and mapping of phase distributions by ACOM.
Materials Science and Technology 16 (2000) 1389-1392R.A. Schwarzer
Modern diffraction techniques for texture analysis.
in R.K. Ray et al. (eds.): Materials for the Third Millenium, Oxford & IBH Publ. Co., New Delhi 2001, pp. 171-195H.J. Bunge and R.A. Schwarzer
Orientation stereology - A new branch in texture research.
Advanced Engineering Materials 3 (2001) 25-39A.K. Singh and R.A. Schwarzer
Evolution of cold rolling texture in the binary alloys Ti-0.4Mn and Ti-1.8 Mn
Materials Science and Engineering A307 (2001) 151-157R.A. Schwarzer
EBSD studies of interconnect lines.
Revue de Metallurgie - SF2M - JA2001 (2001) 65R.A. Schwarzer
Phase discrimination by automated BKD.
Analytical and Bioanalytical Chemistry (ABC) 374 (2002) 699-702R.A. Schwarzer and J. Sukkau
Automated evolution of Kikuchi patterns by means of Radon and Fast Fourier Transformation, and verification by an artificial neural network.
Advanced Engineering Materials 5 (2003) 601-606
J. Pospiech, R.A. Schwarzer and K. Wiencek
Opracowanie danych z automatycznych promiarów dyfrakczyjnych.
(In Polish language: Data elaboration from automatic diffraction measurements.)
Proc. KomPlasTech 2003, 215-222.J. Pospiech, M. Ostafin and R.A. Schwarzer
Microstructural aspects of cross rolling of copper.
Inzynieria Materialowa 24 (2003) 802-805I.V. Gervas'eva, B.K. Sokolov, R.A. Schwarzer, V.V. Gubernatorov and Ya. V. Podkin
Effect of the initial grain size on the structural inhomgeneity and texture formation upon cold rolling and annealing of the Fe-3% Si alloy.
The Physics of Metals and Metallography 96 Suppl. 1 (2003) S43-S52R.A. Schwarzer
Automated grain orientation measurement by backscatter Kikuchi diffraction.
The Physics of Metals and Metallography 96 Suppl. 1 (2003) S104-S115Z. Jasienski, J. Pospiech, A. Piatkowski, R. Schwarzer, A. Litwora and M. Ostafin
Textural and structural effects of the change of deformation path in copper single crystals in a channel-die test.
Archives of Metallurgy and Materials 49 (2004) 11-28Z. Jasienski, J. Pospiech, R. Schwarzer, A. Piatkowski and A. Litwora
Inhomogeneity of deformation induced by the change of deformation path in channel-die compressed (112)[11-1] copper single crystals.
Inzynieria Materialowa 25 (2004) 359-363C. Esling, M. Humbert, R.A. Schwarzer and F. Wagner (eds.): Proc. 2nd Intern. Conf. on Texture and Anisotropy of Polycrystals (ITAP-2).
Solid State Phenomena 105 (2005).
TransTech Publ. Ütikon-Zürich, ISBN 3-908451-09-4R.A. Schwarzer
Texture in hot extruded, hot rolled and laser welded magnesium base alloys.
Solid State Phenomena 105 (2005) 23-28R.A. Schwarzer
Deformation textures of fcc metals subjected to frictional and abrasive wear.
Solid State Phenomena 105 (2005) 195-200J. Pospiech, Z. Jasienski, M. Ostafin and R.A. Schwarzer
Local and global effects in texture and microstructure observed after channel-die compression of copper single crystals and after cross-rolling of copper sheets.
Solid State Phenomena 105 (2005) 321-326M. Ostafin, J. Pospiech and R.A. Schwarzer
Microstructure and texture in copper sheets after reverse and cross rolling.
Solid State Phenomena 105 (2005) 309-314J. Pospiech, M. Ostafin and R.A. Schwarzer
Tekstura i mikrostruktura (i ich wzajemne relacje) po walcowaniu poprzecznym i diagonalnym. (In polnischer Sprache: Textur und Gefüge (und ihre Wechselwirkung) beim Kreuz- und Diagonalwalzen)
in: H. Paul (ed.): Niejednorodnosci odksztalcenia w procesach przerobki plastycznei i rekrystalizacji. PAN IMIM Kraków, ISBN 83-921845-0-5, 2005, pp. 49-59R.A. Schwarzer
Advances in the analysis of texture and microstructure.
Archives of Metallurgy and Materials 50/1 (2005) 7-20M. Ostafin, J. Pospiech and R.A. Schwarzer
The evolution of deformation texture in copper by unidirectional and by cross rolling.
Archives of Metallurgy and Materials 50/2 (2005) 409-415R.A. Schwarzer
Local texture and back-end defect in hot extruded AZ91 magnesium alloy.
Z. Metallkunde 96 (2005) 1005-1008R.A. Schwarzer
Texture mapping by scanning X-ray diffraction and related methods.
In: A.K.Singh (ed.): Advanced X-ray Techniques in Research and Industry. pp.50-65
IOS Press, Amsterdam, The Netherlands, 2005 ISBN: 1-58603-537-1R.A.Schwarzer
Crystal orientation measurement by backscatter Kikuchi diffraction.
Z. Kristallographie Suppl. 23 (2006) 163-168D. Rammlmair, M. Wilke, K. Rickers, R.A. Schwarzer, A. Möller and A. Wittenberg
Methodological developments and applications - 7.6 Geology, mining, metallurgy. pp. 640-687
in: B. Beckhoff, B. Kanngießer, N. Langhoff, R. Wedell und H. Wolf (eds.): Handbook of Practical X-Ray Fluorescence Analysis.
Springer-Verlag Berlin Heidelberg, 2006 ISBN: 3-540-28603-9A.K. Singh and R.A. Schwarzer
Development of cold rolling texture in the binary Ti-0.4Mn alloy.
Metals Materials and Processes 18 (2006) 351-360R.A. Schwarzer
The preparation of Mg, Cd and Zn samples for crystal orientation mapping with BKD in an SEM.
Microscopy Today 15/March (2007) 40, 42R.A. Schwarzer
Spatial resolution in ACOM - What will come after EBSD.
Microscopy Today 16/January (2008) 34-37R.A. Schwarzer
A fast ACOM/EBSD system.
Archives of Metallurgy and Materials 53 (2008) 5-10