Individual
grain orientation measurement in the SEM
from backscatter Kikuchi patterns (BKP)
Our contributions
1989 |
(Peltier cooled) CCD camera employed for BKD |
1993 |
Intensified CCD camera, interactive measurement
of BKD |
1994 |
Digital beam scan for automated BKD |
1997 |
ACOM (ORKID/SEM) |
1998 |
Iterative refinement of the scanning grid ("mesh refinement") |
2001 |
Radon Transform and Artificial Neural Networks |
2007 |
Fast EBSD in cooperation with Prof. Dr. Jarle Hjelen, Trondheim |