Individual grain orientation measurement in the SEM
from backscatter Kikuchi patterns (BKP)

Our contributions

1989

(Peltier cooled) CCD camera employed for BKD

1993

Intensified CCD camera, interactive measurement of BKD
Modified ORKID/TEM version, supports all crystal symmetries.

1994

Digital beam scan for automated BKD

1997

ACOM (ORKID/SEM)
The SEM is operated under full control of ACOM software:
. dynamic focusing and dynamic system calibration,
. automatic setup
calibration,
. all working distances and magnifications
of the SEM are available for ACOM,
. a
utomatic acquisition of flat images,
.
Radon transform (RT), no butterfly mask is used,
. Pattern quality
computed from RT and 1D FFT.

1998

Iterative refinement of the scanning grid ("mesh refinement")

2001

Radon Transform and Artificial Neural Networks

2007

Fast EBSD in cooperation with Prof. Dr. Jarle Hjelen, Trondheim

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